The Defect Detection Reference Design enables real-time identification and classification of defects in manufacturing, assembly, and inspection processes at the edge. Built on the Lattice CertusPro-NX FPGA System-on-Module (SOM), this solution integrates compute, memory, connectivity, and AI acceleration for robust, low-power vision intelligence in industrial automation and quality control applications.
This reference design supports:
- Detection of surface defects, cracks, scratches, and anomalies on products or components
- Classification of defect types and severity in real time
- Dynamic overlay of defect locations and labels on video output
- Scalable architecture for high-resolution image processing
- Seamless integration with host processors (e.g., Raspberry Pi CM5) via MIPI and I2C
- Flexible deployment for automated inspection, sorting, and process optimization
Features
- Instantly identify and classify defects, enabling rapid response and corrective action
- Efficient AI models optimized for edge devices, supporting continuous inspection
- Supports a wide range of defect types and deployment scenarios
- Easily connects to existing inspection systems and legacy infrastructure
- Accurate detection for improved product quality and reduced waste
